IEEE International Workshop on Physical Attacks and Inspection of Electronics (PAINE) aims to take the advantage of physical analysis methods including microscopy, characterization, micro-analysis, etc. to improve the hardware security of electronics. PAINE will bring together experts from instrumentation and hardware security worlds together to share ideas and solutions to make Integrated Circuits hardware safe and secure.
PAINE is soliciting abstracts in the following topic areas:
Registration of Title + 1 page Abstract:
Notification of Acceptance:
Submission of final paper:
April 12 2018
April 17, 2018
May 10, 2018
Please prepare your paper in Standard IEEE 2-column PDF format.
Paper length is 6 pages. If you need extra pages, there is an extra page fee that you can pay during registration.